>> P.232
MEASURINGUNITBench-topTypewithDisplayUnitLSM-9506•Withadesignthatintegratesthedisplaysectionandmeasuringsectionintooneunit,thisinstrumentisbestsuitedformakingbench-topmeasurementsinaninspectionroom.•Optionalcalibrationgageset(ø1.0mm,ø60mm)SpecificationsOrderNo.TypeMeasuringrangeResolutionRepeatability*1Accuracy*2(20°C)Positionalerror*3(opticalaxis/scanningdirection)Measuringrange*4ScanningrateLaserwavelengthLaserscanningspeedStandardinterfaceOptionalinterfacePowersupplyOperatingenvironment544-115*mm0.5to60mm0.05to100µm(selectable)544-116**inch/mm0.02to2.36in/0.5to60mm0.000002to0.005in/0.00005to0.1mm±0.6µm(±0.00003in)±2.5µm(±0.0001in)±2.5µm(±0.0001in)L:Displacementbetweenworkpiececenterandopticalaxiscenter±5×60mm(±0.2×2.36in)1600scans/s650nm(Visible)*5226m/s(8900in/s)RS-232C,Digimaticcodeoutputunit(1ch)NoAC100Vto240V±10%,40VA,50/60Hz0to40°C,RH35to85%(non-condensing)*1:Determinedatthelevelof±2σ(:standarddeviation)whenmeasuringø10mmattheintervalof0.32sec.(average512times).*2:Appliesatthecenterofthemeasuringrangewhenmeasuringoutsidediameters.*3:ΔD=Differenceindiameterbetweenthemastergageandworkpiece(Unit:mm)*4:Anerrorinoutsidediametermeasurementduetovariationinworkpiecepositioneitherintheopticalaxisdirectionorinthescanningdirection.*5:FDAClassII(544-116-1A)/IECClass2(Allmodelsexcept544-116-1A)semiconductorlaserforscanning(Maximumpower:1.0mW)*TodenoteyourACpowercableaddthefollowingsuffixestotheorderNo.:DforCEE,DCforCCC,EforBS,FforSAA,KforKC,CandNosuffixarerequiredforPSE.**TodenoteyourACpowercableaddthefollowingsuffixestotheorderNo.:AforUL/CSA,DforCEE,DCforCCC,EforBS,KforKC,CandNosuffixarerequiredforPSE.16-digitplus11-digitfluorescentdisplay,andguidemessageLED1to7(1to3,transparent)or1to255edgesArithmeticaverage:1to2048scans.Movingaverage:32to2048scans.Selectionfrom"targetvalue+tolerance","lowertolerance+uppertolerance",or"7classesmultilimittolerancezone".Standby,Singlemeasurement,ContinuousmeasurementMaximum,Minimum,Average,Dispersion,σ(S.D)Nominalsetting,samplesetting,suppressionofunnecessarydigits,transparentobjectmeasurement,automaticmeasurementinedgemode,outputtimer,abnormaldataelimination,SHLchange,groupjudgment,simultaneousmeasurement,statisticalprocessing,mastering,buzzerfunction,automaticworkpiecedetection(dimension/position),zero-set/offsetNote:Inthecaseofdualmeasuring-unitconnection,extra-finelinemeasurementandsomeofthecommunicationcommandsarenotavailableDisplayunitDisplaySegmentAveragingtimesJudgmentMeasurementmodeStatisticalanalysisOthers5-19
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